APPLICATION NOTE II(영문)

03 www.coxem.com 1. Effect of Working Distance Depth of Field at WD=50 mm Depth of Field at WD=9 mm INTRODUCTION ‘Depth of Field’ can be controlled in every product of COXEM. - EM-30 Series - CX-200Plus Availability Operation Users can deepen the depth of field by adjusting WD when observing a specimen whose surface is rough, with some difference in height. Analysis Solution for: - Automotive Industries - Material Industries - Bioecology - Sandstone Industries Benefits <Spring samples> ‘Depth of Field’ is adjustable, regardless of the vacuum state; if the distance between the objective lens and specimen increases, the focus area also increases. Another way to increase focus area is to set the electron beam’s size small. Scanning Electron Microscopes (SEM), of which the depth of field is very deep, are more effective when observing an object with big undulations. To increase the depth of field, it is important to extend the Working Distance (WD) between the objective lens and specimen to deepen the depth of field for observation.

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