EM-30N-영문

Electronmicroscope can realize images by collecting the different signals generated from samples with electronic beam. The SE detector can get data as created by ruggedness by capturing secondary electrons merging, which presents the images of the forms and shapes of samples on a single screen. Dual Image/SignalMixingMode SE BSE SE+BSE Minerals Metals SE BSE SE+BSE Semiconductor SE BSE SE+BSE SE BSE-COMPO BSE-TOPO